• DocumentCode
    2752345
  • Title

    Fsimac: a fault simulator for asynchronous sequential circuits

  • Author

    Sur-Kolay, Susmita ; Roncken, Marly ; Stevens, Ken ; Chaudhuri, Parimal Pal ; Roy, Rob

  • Author_Institution
    Indian Stat. Inst., Calcutta, India
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    114
  • Lastpage
    119
  • Abstract
    At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper presents Fsimac, a gate-level fault simulator for stuck-at and gate-delay faults in asynchronous sequential circuits. Fsimac not only evaluates combinational logic and typical asynchronous gates such as Muller C-elements, but also complex domino gates, which are widely used in high-speed designs. Our algorithm for desecting feedback loops is designed so as to minimize the iterations for simulating the unfolded circuit. We use min-max timing analysis to compute the bounds on the signal delays. Stuck-at faults are detected by comparing logic values at the primary outputs against the corresponding values in the fault-free design. For delay faults, we additionally compare min-max rime stamps for primary output signals. Fault coverage reported by Fsimac for pseudo-random tests generated by Cellular Automata show some very good results, but also indicate test holes for which more specific patterns are needed. We intend to deploy Fsimac for designing more effective CA-BIST
  • Keywords
    asynchronous circuits; built-in self test; cellular automata; fault simulation; iterative methods; logic testing; sequential circuits; timing; CA-BIST; Cellular Automata; Fsimac; Muller C-elements; asynchronous sequential circuits; combinational logic; complex domino gates; delay faults; fault simulator; feedback loops; gate-delay faults; gate-level fault simulator; high-speed design; iterations; min-max rime stamps; min-max timing analysis; pseudo-random tests; stuck-at faults; waveform model; Asynchronous circuits; Automatic testing; Circuit faults; Circuit simulation; Clocks; Feedback loop; Frequency; Logic design; Sequential circuits; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
  • Conference_Location
    Taipei
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-0887-1
  • Type

    conf

  • DOI
    10.1109/ATS.2000.893612
  • Filename
    893612