DocumentCode :
2752345
Title :
Fsimac: a fault simulator for asynchronous sequential circuits
Author :
Sur-Kolay, Susmita ; Roncken, Marly ; Stevens, Ken ; Chaudhuri, Parimal Pal ; Roy, Rob
Author_Institution :
Indian Stat. Inst., Calcutta, India
fYear :
2000
fDate :
2000
Firstpage :
114
Lastpage :
119
Abstract :
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper presents Fsimac, a gate-level fault simulator for stuck-at and gate-delay faults in asynchronous sequential circuits. Fsimac not only evaluates combinational logic and typical asynchronous gates such as Muller C-elements, but also complex domino gates, which are widely used in high-speed designs. Our algorithm for desecting feedback loops is designed so as to minimize the iterations for simulating the unfolded circuit. We use min-max timing analysis to compute the bounds on the signal delays. Stuck-at faults are detected by comparing logic values at the primary outputs against the corresponding values in the fault-free design. For delay faults, we additionally compare min-max rime stamps for primary output signals. Fault coverage reported by Fsimac for pseudo-random tests generated by Cellular Automata show some very good results, but also indicate test holes for which more specific patterns are needed. We intend to deploy Fsimac for designing more effective CA-BIST
Keywords :
asynchronous circuits; built-in self test; cellular automata; fault simulation; iterative methods; logic testing; sequential circuits; timing; CA-BIST; Cellular Automata; Fsimac; Muller C-elements; asynchronous sequential circuits; combinational logic; complex domino gates; delay faults; fault simulator; feedback loops; gate-delay faults; gate-level fault simulator; high-speed design; iterations; min-max rime stamps; min-max timing analysis; pseudo-random tests; stuck-at faults; waveform model; Asynchronous circuits; Automatic testing; Circuit faults; Circuit simulation; Clocks; Feedback loop; Frequency; Logic design; Sequential circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
ISSN :
1081-7735
Print_ISBN :
0-7695-0887-1
Type :
conf
DOI :
10.1109/ATS.2000.893612
Filename :
893612
Link To Document :
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