DocumentCode
2752386
Title
Classification framework for nailfold capillary microscopy images
Author
Wen, Chia-Hsien ; Liao, Wei-Duen ; Li, Kuan-Ching
Author_Institution
Providence Univ., Taichung
fYear
2007
fDate
Oct. 30 2007-Nov. 2 2007
Firstpage
1
Lastpage
4
Abstract
Nailfold capillary microscopy examination has been used since late 1950s as a non-invasive in-vivo technique for diagnosing and monitoring connective tissue disease in adults. Disorders such as Raynaud´s phenomenon, progressive systemic sclerosis, and rheumatoid arthritis were detected in more than 80% of adult patients, by analyzing such high resolution images. In this research paper, we propose a framework to classify nailfold capillary microscopy images into SLE (Systemic Lupus Erythematosus) and PSS (Progress Systemic sclerosis) diseases. Based on statistical data collected in Taichung Veteran´s General Hospital (TCVGH), Taiwan, higher percentage of adult patients are find with SLE patients, when compared with PSS. According to ARA (American Rheumatism Association), patients´ outside features are obviously. The PSS patients are the same way to finding the features. And in the same time, we refer from doctor´s idea add other conditions to help judging. In the first step, RP is the most important element. Most of the SLE and PSS features are raised by RP. In the other way, the features can be found in both of SLE and PSS patients. In order to divide the SLE and PSS patients into the correct class, other conditions are existed in necessary.
Keywords
diseases; medical image processing; patient monitoring; American Rheumatism Association; Raynaud phenomenon; Taichung Veteran´s General Hospital; Taiwan; nailfold capillary microscopy; noninvasive in-vivo technique; patient condition; patient diagnosis; progress systemic sclerosis diseases; progressive systemic sclerosis; rheumatoid arthritis; statistical data; systemic lupus erythematosus; tissue disease; Arthritis; Biomedical imaging; Computer science; Diseases; Hospitals; Image resolution; Immune system; Medical diagnostic imaging; Microscopy; Pediatrics;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2007 - 2007 IEEE Region 10 Conference
Conference_Location
Taipei
Print_ISBN
978-1-4244-1272-3
Electronic_ISBN
978-1-4244-1272-3
Type
conf
DOI
10.1109/TENCON.2007.4428910
Filename
4428910
Link To Document