On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction

Author

Dworak, Jennifer ; Grimaila, Michael R. ; Cobb, Brad ; Wang, T.-C. ; Wang, Li C. ; Mercer, M. Ray

Author_Institution

Comput. Eng. Group, Texas A&M Univ., College Station, TX, USA

fYear

2000

fDate

2000

Firstpage

151

Lastpage

157

Abstract

Uses data collected from benchmark circuit simulations to examine the relationship between the tests which detect stuck-at faults and those which detect bridging surrogates. We show that the coefficient of correlation between these tests approaches zero as the stuck-at fault coverage approaches 100%. An enhanced version of the MPG-D model, which is based upon the number of detections of each site in a logic circuit, is shown to be superior to stuck-at fault coverage-based defective part level prediction. We then compare the accuracy of both predictors for an industrial circuit tested using two different test pattern sequences

Keywords

automatic test pattern generation; circuit simulation; fault simulation; integrated circuit testing; integrated logic circuits; ATPG; DO-RE-ME technique; MPG-D model; benchmark circuit simulations; bridging surrogate detection; correlation coefficient; defective part level prediction; industrial circuit; logic circuit; predictor accuracy; stuck-at fault coverage; stuck-at fault detection tests; test pattern sequences; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit testing; Logic circuits; Logic testing; Pattern analysis; Predictive models;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian

Conference_Location

Taipei

ISSN

1081-7735

Print_ISBN

0-7695-0887-1

Type

conf

DOI

10.1109/ATS.2000.893618

Filename

893618