Abstract :
Presents the welcome message from the conference proceedings.
Keywords :
Asia; Circuit testing; Cities and towns; Conferences; Educational technology; Integrated circuit testing; Marine technology; South America; System testing; Systems engineering and theory;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
