• DocumentCode
    2752857
  • Title

    Application of linearization modeling technology for nonlinear RF power devices

  • Author

    Lin, Maoliu ; Hua, Xiaojie ; Sun, Hongjian ; Jiang, Jing

  • Author_Institution
    Harbin Inst. of Technol., Harbin
  • fYear
    2007
  • fDate
    Oct. 30 2007-Nov. 2 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Based on nonlinear large-signal scattering functions theory and harmonic superposition principle, we describe a novel method to linearize the scattering function in a form that is similar with classical scatter parameter when considering the influence of the conjugate term of incident signal. Moreover, in case of weakly nonlinear device, combining phase normalization and linearization technique, we analyze the expression of linearized scattering function in polar coordinates and predict the characters of the track of reflected waves. Further examination of these characters, we prove that they are derived from the emergence of conjugate term. To testify the linearization model, we apply this linearization model technique for modeling high electron mobility transistor (HEMT) on large signal network analyzer platform. Finally, after contrasting the linearization model with classical scatter parameter model for the measurements data, we conclude with the efficiency of the model for modeling RF devices.
  • Keywords
    electromagnetic wave reflection; electromagnetic wave scattering; high electron mobility transistors; linearisation techniques; harmonic superposition principle; high electron mobility transistor; linearization modeling technology; linearized scattering function; nonlinear RF power devices; nonlinear large-signal scattering functions theory; phase normalization; Equations; Frequency estimation; HEMTs; Jacobian matrices; MODFETs; Radio frequency; Scattering parameters; Signal analysis; Sun; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2007 - 2007 IEEE Region 10 Conference
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-1272-3
  • Electronic_ISBN
    978-1-4244-1272-3
  • Type

    conf

  • DOI
    10.1109/TENCON.2007.4428933
  • Filename
    4428933