Abstract :
This paper dealt with the following topics: built-in self-test; fault diagnosis; mixed-signal testing; low-power testing; on-line testing; silicon debug; delay testing; system test; DFT; RF testing; analog testing; SoC test; test data compression; fault modeling; memory test; defect-based testing; and other related topics discussed in test generation, and, industrial and panel sessions.
Keywords :
built-in self test; delay circuits; design for testability; fault diagnosis; low-power electronics; mixed analogue-digital integrated circuits; program debugging; random-access storage; system-on-chip; DFT; RF testing; SoC test; analog signal testing; analog testing; built-in self-test; defect-based testing; delay testing; fault diagnosis; fault modeling; low-power testing; memory test; mixed-signal testing; on-line testing; silicon debug; test data compression; test generation;
