Title :
Compact Test Generation for Small-Delay Defects Using Testable-Path Information
Author :
Xiang, Dong ; Yin, Boxue ; Chakrabarty, Krishendu
Author_Institution :
Sch. of Software, Tsinghua Univ., Beijing, China
Abstract :
Testing for small-delay defects requires fault-effect propagation along the longest testable paths. However, the selection of the longest testable paths requires high CPU time and leads to large pattern counts. Dynamic test compaction for small-delay defects has remained largely unexplored thus far. We propose a path-selection scheme to accelerate ATPG based on stored testable critical-path information. A new dynamic test-compaction technique based on structural analysis is also introduced. Simulation results are presented for a set of ISCAS´89 benchmark circuits.
Keywords :
automatic test pattern generation; circuit reliability; circuit testing; delays; fault diagnosis; ATPG; CPU time; benchmark circuits; compact test generation; dynamic test compaction; fault effect propagation; path-selection scheme; small-delay defects; structural analysis; testable critical-path information; Automatic test pattern generation; Circuit faults; Circuit testing; Clocks; Compaction; Fault detection; Propagation delay; Software testing; Test pattern generators; Timing;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.44