DocumentCode
2753475
Title
A method for determining whether asynchronous circuits are self-checking
Author
Liebelt, Michael J. ; Lim, Cheng-Chew
Author_Institution
Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
fYear
2000
fDate
2000
Firstpage
472
Lastpage
477
Abstract
While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available
Keywords
asynchronous circuits; design for testability; fault diagnosis; integrated circuit noise; integrated circuit testing; logic testing; low-power electronics; TSC; low noise properties; low power; output stuck-at-faults; semi-modular asynchronous circuit; testability; totally self-checking; Asynchronous circuits; Automatic testing; Circuit faults; Circuit noise; Circuit testing; Delay; Logic testing; Power engineering and energy; System recovery; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location
Taipei
ISSN
1081-7735
Print_ISBN
0-7695-0887-1
Type
conf
DOI
10.1109/ATS.2000.893669
Filename
893669
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