DocumentCode :
2753475
Title :
A method for determining whether asynchronous circuits are self-checking
Author :
Liebelt, Michael J. ; Lim, Cheng-Chew
Author_Institution :
Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
fYear :
2000
fDate :
2000
Firstpage :
472
Lastpage :
477
Abstract :
While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available
Keywords :
asynchronous circuits; design for testability; fault diagnosis; integrated circuit noise; integrated circuit testing; logic testing; low-power electronics; TSC; low noise properties; low power; output stuck-at-faults; semi-modular asynchronous circuit; testability; totally self-checking; Asynchronous circuits; Automatic testing; Circuit faults; Circuit noise; Circuit testing; Delay; Logic testing; Power engineering and energy; System recovery; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
Conference_Location :
Taipei
ISSN :
1081-7735
Print_ISBN :
0-7695-0887-1
Type :
conf
DOI :
10.1109/ATS.2000.893669
Filename :
893669
Link To Document :
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