• DocumentCode
    2753475
  • Title

    A method for determining whether asynchronous circuits are self-checking

  • Author

    Liebelt, Michael J. ; Lim, Cheng-Chew

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    472
  • Lastpage
    477
  • Abstract
    While asynchronous circuits offer potential advantages over synchronous circuits, particularly in the form of low power and low noise properties, it is widely held that they are more difficult to test. The self-checking properties of semi-modular asynchronous circuits with respect to certain stuck-at faults have been known for many years, but the restrictions have been such that it has not been feasible to make use of this property to enhance testability. In this paper we demonstrate the feasibility of a technique to determine whether a proposed asynchronous circuit implementation is totally self-checking with respect to all output stuck-at-faults. This test can he incorporated into the design process to select a self-checking implementation when several alternatives are available
  • Keywords
    asynchronous circuits; design for testability; fault diagnosis; integrated circuit noise; integrated circuit testing; logic testing; low-power electronics; TSC; low noise properties; low power; output stuck-at-faults; semi-modular asynchronous circuit; testability; totally self-checking; Asynchronous circuits; Automatic testing; Circuit faults; Circuit noise; Circuit testing; Delay; Logic testing; Power engineering and energy; System recovery; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
  • Conference_Location
    Taipei
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-0887-1
  • Type

    conf

  • DOI
    10.1109/ATS.2000.893669
  • Filename
    893669