• DocumentCode
    2753575
  • Title

    Accumulation-based concurrent fault detection for linear digital state variable systems

  • Author

    Bayraktaroglu, Ismet ; Orailoglu, Alex

  • Author_Institution
    California Univ., San Diego, La Jolla, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    484
  • Lastpage
    488
  • Abstract
    An algorithmic fault detection scheme for linear digital state variable systems is proposed. The proposed scheme eliminates the necessity of observing the internal states of the system for concurrent fault detection by utilizing an accumulation-based approach. Observation merely of the inputs and the outputs results in significantly reduced area overhead and no performance penalty. Experimental results verify that 100% concurrent fault detection is attainable for linear digital state variable systems
  • Keywords
    digital filters; digital signal processing chips; digital systems; error detection; fault diagnosis; linear systems; logic testing; accumulation-based approach; algorithmic fault detection scheme; area overhead; concurrent fault detection; error detection; linear digital state variable systems; Computer errors; Computer science; Costs; Digital filters; Digital signal processing; Digital systems; Equations; Fault detection; Fault tolerant systems; Hardware;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2000. (ATS 2000). Proceedings of the Ninth Asian
  • Conference_Location
    Taipei
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-0887-1
  • Type

    conf

  • DOI
    10.1109/ATS.2000.893671
  • Filename
    893671