Title :
Multi-photon resonant ionization of xenon in the vicinity of 440 nm
Author :
Lu, Zhenzhong ; Chen, Deying ; Fan, Rongwei ; Xia, Yuanqin ; Zhang, Hongying
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Tunable Laser, Harbin Inst. of Technol., Harbin, China
fDate :
July 28 2010-Aug. 1 2010
Abstract :
By combining the pulse molecular beam technique and time of flight mass spectrum, the multiphoton resonance ionization of Xe in the vicinity of 440 nm is studied. The dependence of resonant ionization on laser energy and source pressure of Xe was analyzed and discussed. The resonant ionization spectrum near 440 nm was obtained and the AC Stark effect was determined to be the major cause of asymmetric line broadening in the low pressure multiphoton ionization spectrum of xenon. The results show that spectrum broadening could be ascribed to cooperative effects from different laser energy and electric field.
Keywords :
Stark effect; atom-photon collisions; molecular beams; multiphoton spectra; photoionisation; spectral line broadening; time of flight mass spectra; xenon; AC Stark effect; Xe; asymmetric line broadening; cooperative effects; laser energy; low pressure multiphoton ionization spectrum; multiphoton resonant ionization; pulse molecular beam technique; source pressure; time of flight mass spectrum; xenon; Atomic beams; Electric fields; Ionization; Laser excitation; Photonics; Xenon; Multiphoton Resonant Ionization; Time-of-Flight Mass Spectrum; Xe;
Conference_Titel :
Laser Physics and Laser Technologies (RCSLPLT) and 2010 Academic Symposium on Optoelectronics Technology (ASOT), 2010 10th Russian-Chinese Symposium on
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-5511-9
DOI :
10.1109/RCSLPLT.2010.5615386