Title :
Low current and low voltages-the high-end op amp testing challenge
Author :
Cometta, Bob ; Witte, Jan
Author_Institution :
Burr-Brown Corp., Tucson, AZ, USA
Abstract :
State-of-the-art op amps with input bias currents in the fA range and offset voltages of several μV present special test problems. The authors discuss the measurement problems and their possible solutions. The topics discussed include: DSP based input bias current measurement; leakage current compensation; and current loop feedback
Keywords :
automatic test equipment; automatic testing; electric current measurement; feedback amplifiers; leakage currents; operational amplifiers; DSP; current loop feedback; fA range; input bias current measurement; input bias currents; leakage current compensation; offset voltages; operational amplifier testing; Circuit testing; Fixtures; Hardware; Insulation; Leakage current; Low voltage; Operational amplifiers; Relays; Sockets; Surface resistance;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639693
