DocumentCode
2753848
Title
Sub-nano resolution static strain fiber sensor using a novel sideband interrogation technique
Author
Liu, Qingwen ; He, Zuyuan ; Tokunaga, Tomochika ; Hotate, Kazuo
Author_Institution
Dept. of Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
fYear
2011
fDate
9-13 Oct. 2011
Firstpage
927
Lastpage
928
Abstract
A novel sideband interrogation technique was proposed to measure the resonance difference between two Fabry-Perot interferometers. With this technique sub-nano static strain-resolution was demonstrated experimentally for the first time to the best of our knowledge.
Keywords
Fabry-Perot interferometers; fibre optic sensors; strain sensors; Fabry-Perot interferometers; resonance difference; sideband interrogation technique; sub-nano resolution static strain fiber sensor; sub-nano static strain-resolution; Amplitude modulation; Fiber lasers; Geophysical measurements; Measurement by laser beam; Optical fiber sensors; RF signals; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics Conference (PHO), 2011 IEEE
Conference_Location
Arlington, VA
Print_ISBN
978-1-4244-8940-4
Type
conf
DOI
10.1109/PHO.2011.6110863
Filename
6110863
Link To Document