DocumentCode
2753954
Title
A Multi-dimensional Pattern Run-Length Method for Test Data Compression
Author
Lee, Lung-Jen ; Tseng, Wang-Dauh ; Lin, Rung-Bin ; Lee, Chen-Lun
Author_Institution
Dept. of Comput. Sci. & Eng., Yuan Ze Univ., Chungli, Taiwan
fYear
2009
fDate
23-26 Nov. 2009
Firstpage
325
Lastpage
330
Abstract
This paper presents a run-length-based compression method considering dimensions of pattern information. Information such as pattern length and number of pattern runs is encoded to denote the compression status. The decoder is simple and requires very low hardware overhead. Significant improvements are experimentally demonstrated on larger ISCAS´89 benchmarks.
Keywords
data compression; integrated circuit testing; system-on-chip; SOC; multi-dimensional pattern run-length method; pattern information dimension; pattern length; pattern number; run-length-based compression method; test data compression; Circuit faults; Circuit testing; Costs; Decoding; Encoding; Hardware; Huffman coding; Integrated circuit testing; Intellectual property; Test data compression; ATE; SOC; code-based testing; pattern run-length; test data compression;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2009. ATS '09.
Conference_Location
Taichung
ISSN
1081-7735
Print_ISBN
978-0-7695-3864-8
Type
conf
DOI
10.1109/ATS.2009.49
Filename
5359318
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