DocumentCode
275399
Title
Behavioral fault simulation in VHDL
Author
Ward, P.C. ; Armstrong, J.R.
Author_Institution
Robertshaw Controls Co., Richmond, VA, USA
fYear
1990
fDate
24-28 Jun 1990
Firstpage
587
Lastpage
593
Abstract
Two tools which facilitate a fault simulation of behavioral models described using the VHSIC hardware description language (VHDL) are presented. The first tool is the behavioral fault mapper (BFM). The BFM algorithm accepts a fault-free VHDL model and a fault-list of N faults from which it produces N faulty models. The process of mapping the faults in the fault-list onto copies of the original VHDL model is automated. The N faulty models are immediately suitable for fault simulation. The second tool presented is test bench generator (TBG). The TBG algorithm creates the VHDL testbench and all other files necessary to complete a batch-mode fault simulation of the N faulty models
Keywords
VLSI; electronic engineering computing; fault location; integrated circuit testing; specification languages; VHDL; VHSIC hardware description language; batch-mode fault simulation; behavioral fault mapper; behavioural fault simulation; fault simulation; fault-list; test bench generator; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Hardware design languages; Integrated circuit interconnections; Large scale integration; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location
Orlando, FL
ISSN
0738-100X
Print_ISBN
0-89791-363-9
Type
conf
DOI
10.1109/DAC.1990.114922
Filename
114922
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