• DocumentCode
    275399
  • Title

    Behavioral fault simulation in VHDL

  • Author

    Ward, P.C. ; Armstrong, J.R.

  • Author_Institution
    Robertshaw Controls Co., Richmond, VA, USA
  • fYear
    1990
  • fDate
    24-28 Jun 1990
  • Firstpage
    587
  • Lastpage
    593
  • Abstract
    Two tools which facilitate a fault simulation of behavioral models described using the VHSIC hardware description language (VHDL) are presented. The first tool is the behavioral fault mapper (BFM). The BFM algorithm accepts a fault-free VHDL model and a fault-list of N faults from which it produces N faulty models. The process of mapping the faults in the fault-list onto copies of the original VHDL model is automated. The N faulty models are immediately suitable for fault simulation. The second tool presented is test bench generator (TBG). The TBG algorithm creates the VHDL testbench and all other files necessary to complete a batch-mode fault simulation of the N faulty models
  • Keywords
    VLSI; electronic engineering computing; fault location; integrated circuit testing; specification languages; VHDL; VHSIC hardware description language; batch-mode fault simulation; behavioral fault mapper; behavioural fault simulation; fault simulation; fault-list; test bench generator; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Hardware design languages; Integrated circuit interconnections; Large scale integration; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-363-9
  • Type

    conf

  • DOI
    10.1109/DAC.1990.114922
  • Filename
    114922