Title :
The influences of fault type and topology on fault model performance and the implications to test and testable design
Author :
Butler, Kenneth M. ; Mercer, M. Ray
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
A new method, difference propagation, is proposed to analyze fault models in combinational circuits. It propagates Boolean functional information represented by ordered binary decision diagrams. Results are presented concerning exact detectabilities and syndromes for a set of benchmark circuits. The data suggest answers to open questions in CAD and represent the first data of this type for bridging faults. The information is shown to affect testable design, as well as test generation
Keywords :
combinatorial circuits; logic testing; Boolean functional information; benchmark circuits; bridging faults; combinational circuits; difference propagation; fault models; fault type; test generation; testable design; topology; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Design automation; Design engineering; Integrated circuit testing; Logic testing; Topology;
Conference_Titel :
Design Automation Conference, 1990. Proceedings., 27th ACM/IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-89791-363-9
DOI :
10.1109/DAC.1990.114938
