• DocumentCode
    2754124
  • Title

    ErrorTracer: a fault simulation-based approach to design error diagnosis

  • Author

    Huang, Shi-Yu ; Kwang-Ting Cheng ; Chen, Kuang-Chien ; Cheng, David Ihsin

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    974
  • Lastpage
    981
  • Abstract
    This paper addresses the problem of locating error sources in an erroneous combinational circuit. We use a fault simulation-based technique to approximate each signal´s correcting power. The correcting power of a particular signal is measured in terms of the signal´s correctable set, namely, the maximum set of erroneous input vectors that can be corrected by re-synthesizing the signal. Only the signals that can correct every erroneous input vector are considered as a potential error source. Our algorithm offers three major advantages over existing methods. First, unlike symbolic approaches, it is applicable for large circuits. Secondly, it delivers more accurate results than other simulation-based approaches because it is based on a more stringent condition for identifying potential error sources. Thirdly, it can be easily generalized to identify multiple errors. Experimental results on diagnosing circuits with one and two random errors are presented to show the effectiveness and efficiency of this new approach
  • Keywords
    VLSI; combinational circuits; digital simulation; error detection; fault location; integrated circuit testing; integrated logic circuits; logic testing; ErrorTracer; VLSI; combinational circuit; effectiveness; efficiency; fault simulation; multiple error; signal correction; signal error diagnosis; Circuit faults; Circuit simulation; Combinational circuits; Error correction; Fault diagnosis; Logic; Particle measurements; Power measurement; Process design; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639713
  • Filename
    639713