• DocumentCode
    2754275
  • Title

    A study on the thermal reliability of high voltage MOSFET device

  • Author

    Lee, Hyun-Duck ; Yuk, Seung-Bum ; Lee, Jae-Hyeon ; Kwak, Jae-chang ; Kim, Kui-Dong ; Koo, Yong-Seo

  • Author_Institution
    Seokyeong Univ., Seoul
  • fYear
    2007
  • fDate
    Oct. 30 2007-Nov. 2 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this study, the electrical characteristics of high voltage MOSFET(HV-MOSFET) under high temperature were investigated. And, specific on-resistance, threshold voltage, trans-conductance, drain current of the HV-MOSFET were measured over a temperature range of 300 K les T les 450 K. The results of this study indicate that extended drift region length has a great effect on electrical characteristics, but that is does little effect on temperature dependence. The specific on-resistance increases slightly with temperature. Especially, at high temperature(at 450 K), the specific on-resistance increase about 30% than that in room temperature. And, in high temperature condition (at 400 K), drain current decrease about 30%, Also, transconductance(gm) decreases with temperature.
  • Keywords
    MOSFET; semiconductor device reliability; drain current; high voltage MOSFET device; onresistance; thermal reliability; threshold voltage; trans-conductance; Current measurement; Electric variables; Electric variables measurement; MOSFET circuits; Scattering; Temperature distribution; Temperature measurement; Testing; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2007 - 2007 IEEE Region 10 Conference
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-1272-3
  • Electronic_ISBN
    978-1-4244-1272-3
  • Type

    conf

  • DOI
    10.1109/TENCON.2007.4429013
  • Filename
    4429013