DocumentCode
2754340
Title
A unified interface for scan test generation based on STIL
Author
Wohl, Peter ; Waicukauski, John
Author_Institution
Adv. Rest. Technol. Inc., Williston, VT, USA
fYear
1997
fDate
1-6 Nov 1997
Firstpage
1011
Lastpage
1019
Abstract
The Standard Test Interface Language (STIL) was developed for universal pattern interchange form test generation tools output to tester input. We extend the usage of STIL to the various input files of a test generation tool we developed, thus using one language where traditional test tools use five or more. This significantly reduces engineering time to learn the required languages, create and maintain all files. The output STIL file generated contains the information from ail input files, eliminating the confusion often caused by managing multiple versions of multiple files. Users can start with only a minimal input file, have the tool fill in defaults, and write out a complete STIL file. This file can be modified and read back in as any of the input files, allowing stepwise refinements
Keywords
automatic test equipment; automatic test software; design for testability; high level languages; logic testing; software standards; ATPG; CAD; STIL; Standard Test Interface Language; design for testability; multiple files; multiple versions; scan test generation; unified interface; Automatic test pattern generation; Automatic testing; Design automation; Hardware design languages; Integrated circuit testing; Libraries; Maintenance engineering; Test equipment; Test pattern generators; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639718
Filename
639718
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