• DocumentCode
    2754340
  • Title

    A unified interface for scan test generation based on STIL

  • Author

    Wohl, Peter ; Waicukauski, John

  • Author_Institution
    Adv. Rest. Technol. Inc., Williston, VT, USA
  • fYear
    1997
  • fDate
    1-6 Nov 1997
  • Firstpage
    1011
  • Lastpage
    1019
  • Abstract
    The Standard Test Interface Language (STIL) was developed for universal pattern interchange form test generation tools output to tester input. We extend the usage of STIL to the various input files of a test generation tool we developed, thus using one language where traditional test tools use five or more. This significantly reduces engineering time to learn the required languages, create and maintain all files. The output STIL file generated contains the information from ail input files, eliminating the confusion often caused by managing multiple versions of multiple files. Users can start with only a minimal input file, have the tool fill in defaults, and write out a complete STIL file. This file can be modified and read back in as any of the input files, allowing stepwise refinements
  • Keywords
    automatic test equipment; automatic test software; design for testability; high level languages; logic testing; software standards; ATPG; CAD; STIL; Standard Test Interface Language; design for testability; multiple files; multiple versions; scan test generation; unified interface; Automatic test pattern generation; Automatic testing; Design automation; Hardware design languages; Integrated circuit testing; Libraries; Maintenance engineering; Test equipment; Test pattern generators; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1997. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-4209-7
  • Type

    conf

  • DOI
    10.1109/TEST.1997.639718
  • Filename
    639718