DocumentCode :
2754490
Title :
Self-Calibrating Embedded RF Down-Conversion Mixers
Author :
Goyal, Abhilash ; Swaminathan, Madhavan ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2009
fDate :
23-26 Nov. 2009
Firstpage :
249
Lastpage :
254
Abstract :
This paper proposes a self-calibrating approach for embedded RF down-conversion mixers. In the proposed approach, the output of the RF mixer is analyzed by using on-chip resources for testing and the mixer performs self-compensation for parametric defects using tuning knobs. The tuning knobs enable the RF mixer to self-calibrate for multi-parameter variations induced due to process variability. Using this methodology, it is demonstrated that performance compensation of RF down-conversion mixers can be performed simultaneously for critical specifications such as Gain and 1-dB compression point (P1dB).
Keywords :
CMOS integrated circuits; calibration; circuit tuning; integrated circuit testing; mixers (circuits); CMOS process; embedded RF down-conversion mixers; multiparameter variations; on-chip resources; parametric defects; self-calibrating approach; self-compensation; tuning knobs; Analog integrated circuits; Automatic testing; Built-in self-test; CMOS technology; Calibration; RF signals; Radio frequency; Signal generators; Transfer functions; Tuning; RF down-conversion mixer; Self-calibration; Self-testing; Yield improvement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3864-8
Type :
conf
DOI :
10.1109/ATS.2009.77
Filename :
5359342
Link To Document :
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