• DocumentCode
    2754490
  • Title

    Self-Calibrating Embedded RF Down-Conversion Mixers

  • Author

    Goyal, Abhilash ; Swaminathan, Madhavan ; Chatterjee, Abhijit

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2009
  • fDate
    23-26 Nov. 2009
  • Firstpage
    249
  • Lastpage
    254
  • Abstract
    This paper proposes a self-calibrating approach for embedded RF down-conversion mixers. In the proposed approach, the output of the RF mixer is analyzed by using on-chip resources for testing and the mixer performs self-compensation for parametric defects using tuning knobs. The tuning knobs enable the RF mixer to self-calibrate for multi-parameter variations induced due to process variability. Using this methodology, it is demonstrated that performance compensation of RF down-conversion mixers can be performed simultaneously for critical specifications such as Gain and 1-dB compression point (P1dB).
  • Keywords
    CMOS integrated circuits; calibration; circuit tuning; integrated circuit testing; mixers (circuits); CMOS process; embedded RF down-conversion mixers; multiparameter variations; on-chip resources; parametric defects; self-calibrating approach; self-compensation; tuning knobs; Analog integrated circuits; Automatic testing; Built-in self-test; CMOS technology; Calibration; RF signals; Radio frequency; Signal generators; Transfer functions; Tuning; RF down-conversion mixer; Self-calibration; Self-testing; Yield improvement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2009. ATS '09.
  • Conference_Location
    Taichung
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3864-8
  • Type

    conf

  • DOI
    10.1109/ATS.2009.77
  • Filename
    5359342