Title :
Trends in low-power RAM circuit technologies
Author :
Itoh, K. ; Sasaki, K. ; Nakagome, Y.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
Trends in low-power RAM circuit technologies are reviewed. The following provide major contribution to power reduction: lowering operating voltage by lowering the external supply voltage, half-V/sub DD/ data-line precharging and on-chip voltage down converting; reducing charging capacitance through partial activation of multi-divided array, and CMOS NAND decoder; reducing DC current through partial activation of multi-divided word line and pulsed operations of periphery using address transition detection. These contributions have made possible a DRAM active power reduction of as much as 2 to 3 orders of magnitude over the last decade. Moreover, MOS transistor subthreshold current reduction circuits such as source-gate backbiasing scheme, which are essential in an ultra-low voltage era, might reduce an active current of a 1-V 16Gb DRAM from 1.2 A down to 22 mA.
Keywords :
DRAM chips; 1 V; 16 Gbit; 22 mA; CMOS NAND decoder; DRAM; LSI; MOS transistor subthreshold current reduction circuits; address transition detection; charging capacitance; circuit technologies; data-line precharging; external supply voltage; low-power RAM circuit; multi-divided array; multi-divided word line; on-chip voltage down converting; operating voltage; partial activation; power reduction; source-gate backbiasing scheme; CMOS technology; Capacitance; Circuits; Decoding; Laboratories; Power supplies; Random access memory; Read-write memory; Research and development; Voltage;
Conference_Titel :
Low Power Electronics, 1994. Digest of Technical Papers., IEEE Symposium
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1953-2
DOI :
10.1109/LPE.1994.573214