Title :
Application of near-field techniques to radome analysis
Author :
Green, Philip B.
Author_Institution :
Texas Instruments, Dallas, TX, USA
Keywords :
Analytical models; Antenna measurements; Degradation; Design engineering; Hardware; Instruments; Integral equations; Laboratories; NIST; Reflection;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1978
DOI :
10.1109/APS.1978.1147970
