DocumentCode
2754680
Title
SiC and Si transistors comparison in boost converter
Author
Zapico, A. ; Gabiola, Igor ; Apiñaniz, S. ; Santiago, Fabian ; Pujana, A. ; Rodriguez, Alex ; Briz, Fernando
Author_Institution
Electr. Eng. Dept., Univ. of Oviedo, Gijon, Spain
fYear
2012
fDate
4-6 Sept. 2012
Abstract
Development of new wide band gap (WBG) power devices, and among them, of Silicon Carbide (SiC) power devices, has been an active field of research during the last years. Potential advantages SiC devices over their Si counterparts include a significantly higher breakdown field, higher operating temperatures as well as higher switching frequencies. However, manufacturing of SiC power devices is not a mature technology yet, their performance being far from their potential limits. A comparison between SiC and Silicon (Si) power devices is presented in this paper. Three different power devices are analyzed, with the aim of verifying the theoretical improvement in the performance of SiC over Si transistors: SiC JFET, SiC MOSFET and Si IGBT. A boost DC to DC converter topology will be used for this purpose, the European Efficiency being used as a figure of merit to evaluate the performance of each semiconductor. An input voltage varying from 250 V to 500 V, an output voltage of 600 V and 3 kW of nominal output power has been developed and tested.
Keywords
DC-DC power convertors; MOSFET; elemental semiconductors; junction gate field effect transistors; semiconductor device breakdown; silicon; silicon compounds; wide band gap semiconductors; Si; Si IGBT; SiC; SiC JFET; SiC MOSFET; WBG; boost DC-DC converter; breakdown field; power 3 kW; voltage 250 V to 500 V; voltage 600 V; wide band gap power device; Insulated gate bipolar transistors; JFETs; MOSFET circuits; Silicon; Silicon carbide; Switching frequency; Semiconductor devices; SiC devices; power electronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Motion Control Conference (EPE/PEMC), 2012 15th International
Conference_Location
Novi Sad
Print_ISBN
978-1-4673-1970-6
Electronic_ISBN
978-1-4673-1971-3
Type
conf
DOI
10.1109/EPEPEMC.2012.6397197
Filename
6397197
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