• DocumentCode
    2754680
  • Title

    SiC and Si transistors comparison in boost converter

  • Author

    Zapico, A. ; Gabiola, Igor ; Apiñaniz, S. ; Santiago, Fabian ; Pujana, A. ; Rodriguez, Alex ; Briz, Fernando

  • Author_Institution
    Electr. Eng. Dept., Univ. of Oviedo, Gijon, Spain
  • fYear
    2012
  • fDate
    4-6 Sept. 2012
  • Abstract
    Development of new wide band gap (WBG) power devices, and among them, of Silicon Carbide (SiC) power devices, has been an active field of research during the last years. Potential advantages SiC devices over their Si counterparts include a significantly higher breakdown field, higher operating temperatures as well as higher switching frequencies. However, manufacturing of SiC power devices is not a mature technology yet, their performance being far from their potential limits. A comparison between SiC and Silicon (Si) power devices is presented in this paper. Three different power devices are analyzed, with the aim of verifying the theoretical improvement in the performance of SiC over Si transistors: SiC JFET, SiC MOSFET and Si IGBT. A boost DC to DC converter topology will be used for this purpose, the European Efficiency being used as a figure of merit to evaluate the performance of each semiconductor. An input voltage varying from 250 V to 500 V, an output voltage of 600 V and 3 kW of nominal output power has been developed and tested.
  • Keywords
    DC-DC power convertors; MOSFET; elemental semiconductors; junction gate field effect transistors; semiconductor device breakdown; silicon; silicon compounds; wide band gap semiconductors; Si; Si IGBT; SiC; SiC JFET; SiC MOSFET; WBG; boost DC-DC converter; breakdown field; power 3 kW; voltage 250 V to 500 V; voltage 600 V; wide band gap power device; Insulated gate bipolar transistors; JFETs; MOSFET circuits; Silicon; Silicon carbide; Switching frequency; Semiconductor devices; SiC devices; power electronics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Motion Control Conference (EPE/PEMC), 2012 15th International
  • Conference_Location
    Novi Sad
  • Print_ISBN
    978-1-4673-1970-6
  • Electronic_ISBN
    978-1-4673-1971-3
  • Type

    conf

  • DOI
    10.1109/EPEPEMC.2012.6397197
  • Filename
    6397197