A Fast Analytical Approach to Multi-cycle Soft Error Rate Estimation of Sequential Circuits

In this paper, we propose a very fast analytical approach to measure the overall circuit Soft Error Rate (SER) and to identify the most vulnerable gates and flip-flops. In the proposed approach, we first compute the error propagation probability from an error site to primary outputs as well as system bistables. Then, we perform a multi-cycle error propagation analysis in the sequential circuit. The results show that the proposed approach is four to five orders of magnitude faster than the Monte Carlo (MC) simulation-based fault injection approach with 92% accuracy. This makes the proposed approach applicable to industrial-scale circuits.