• DocumentCode
    2754941
  • Title

    LEON3 ViP: A Virtual Platform with Fault Injection Capabilities

  • Author

    Da Silva, Antonio ; Sánchez, Sebastián

  • Author_Institution
    DIATEL-EUIT Telecomun., Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2010
  • fDate
    1-3 Sept. 2010
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    In addition to functional simulation for validation of hardware/software designs, there are additional robustness requirements that need advanced simulation techniques and tools to analyze the system behavior in the presence of faults. In this paper, we present the design of a fault injection framework for LEON3, a 32bit SPARC CPU based system used by the European Space Agency, described at Transaction Level using System C. First of all an extension of a previous XML formalization of basic binary faults, like memory and CPU registers corruption, is done in order to support TLM2.0transaction´s parameters corruptions. Next a novel Dynamic Binary Instrumentation (DBI) technique for C++ binaries is used to insert fault injection wrappers in SystemC transaction path. For binary faults in model components the use of TLM2.0 “transport_dbg” is proposed. This way each component with fault injection capabilities exposes a standard interface to allow internal component inspection and modification.
  • Keywords
    XML; fault diagnosis; formal verification; hardware-software codesign; software prototyping; 32bit SPARC CPU; C++ binary; LEON3; SystemC transaction path; TLM2.0; XML; dynamic binary instrumentation; fault injection capability; hardware-software design; simulation techniques; virtual platform; Circuit faults; Computational modeling; Hardware; Software; Time domain analysis; Time varying systems; XML; Binary Instrumentation; Debug Transport Interface; Fault Injection; LEON3; XML Faultset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design: Architectures, Methods and Tools (DSD), 2010 13th Euromicro Conference on
  • Conference_Location
    Lille
  • Print_ISBN
    978-1-4244-7839-2
  • Type

    conf

  • DOI
    10.1109/DSD.2010.34
  • Filename
    5615462