DocumentCode
2754972
Title
A Tukey’s biweight bayesian approach for a robust iterative SRR of image sequences
Author
Patanavijit, Vorapoj ; Jitapunkul, S.
Author_Institution
Assumption Univ., Bangkok
fYear
2007
fDate
Oct. 30 2007-Nov. 2 2007
Firstpage
1
Lastpage
4
Abstract
The SRR (super-resolution reconstruction) performance degrades severely when the data model assumptions do not faithfully describe the measure data. Therefore, the robust estimator applicable to nonfaithful data models is desired in SRR algorithms. This paper proposes an alternate SRR approach to solve 2 major causes of performance degradation in conventional SRR approaches. The two causes are (1) an invalid assumption of data model and (2) a registration error in registration stage. Our proposed SRR is based on the stochastic regularization technique of Bayesian MAP estimation by minimizing a cost function. The Tukey´s biweight norm is used for measuring the difference between the projected estimate of the high-resolution image and each low resolution image, removing outliers in the data and Tikhonov regularization is used to remove artifacts from the final answer and improve the rate of convergence. The experimental results show that the proposed SRR can apply on real sequence such as Suzie and Foreman sequence and confirm the effectiveness of our method and demonstrate its superiority to other SRR methods based on L1 and L2 norm for a several noise models such as AWGN, Poisson and speckle noise.
Keywords
Bayes methods; image reconstruction; image resolution; image sequences; iterative methods; stochastic processes; SRR performance; Tikhonov regularization; Tukey Biweight Bayesian approach; cost function; image sequences; stochastic regularization technique; super-resolution reconstruction performance; Additive white noise; Bayesian methods; Data models; Degradation; Gaussian noise; Image reconstruction; Image sequences; Iterative algorithms; Iterative methods; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2007 - 2007 IEEE Region 10 Conference
Conference_Location
Taipei
Print_ISBN
978-1-4244-1272-3
Electronic_ISBN
978-1-4244-1272-3
Type
conf
DOI
10.1109/TENCON.2007.4429048
Filename
4429048
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