• DocumentCode
    2754991
  • Title

    Speeding up SAT-Based ATPG Using Dynamic Clause Activation

  • Author

    Eggersgluss, Stephan ; Tille, Daniel ; Drechsler, Rolf

  • Author_Institution
    Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
  • fYear
    2009
  • fDate
    23-26 Nov. 2009
  • Firstpage
    177
  • Lastpage
    182
  • Abstract
    SAT-based ATPG turned out to be a robust alternative to classical structural ATPG algorithms such as FAN. The number of unclassified faults can be significantly reduced using a SAT-based ATPG approach. In contrast to structural ATPG, SAT solvers work on a Boolean formula in conjunctive normal form (CNF). This results in some disadvantages for SAT solvers when applied to ATPG, e.g. CNF transformation time and loss of structural knowledge. As a result, SAT-based ATPG algorithms are very robust for hard-to-test faults, but suffer from the overhead for easy-to-test faults. We propose the SAT technique dynamic clause activation (DCA) in order to reduce the run time gap between structural and SAT-based ATPG algorithms and, at the same time, retain the high level of robustness. Using DCA, the SAT solver works on a partial formula of a logic circuit which is dynamically extended during the search process using structural knowledge. Furthermore, efficient dynamic learning techniques can be easily integrated within the proposed technique. The approach is evaluated on large industrial circuits.
  • Keywords
    Boolean algebra; automatic test pattern generation; computability; fault simulation; Boolean formula; CNF transformation time; FAN; SAT solvers; SAT-based ATPG; classical structural ATPG algorithms; conjunctive normal form; dynamic clause activation; easy-to-test faults; efficient dynamic learning techniques; hard-to-test faults; industrial circuits; logic circuit; search process; structural knowledge; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Compaction; Computer science; Delay; Logic circuits; Robustness; Test pattern generators; ATPG; CNF; Formal methods; SAT;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2009. ATS '09.
  • Conference_Location
    Taichung
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3864-8
  • Type

    conf

  • DOI
    10.1109/ATS.2009.26
  • Filename
    5359366