DocumentCode
2754991
Title
Speeding up SAT-Based ATPG Using Dynamic Clause Activation
Author
Eggersgluss, Stephan ; Tille, Daniel ; Drechsler, Rolf
Author_Institution
Inst. of Comput. Sci., Univ. of Bremen, Bremen, Germany
fYear
2009
fDate
23-26 Nov. 2009
Firstpage
177
Lastpage
182
Abstract
SAT-based ATPG turned out to be a robust alternative to classical structural ATPG algorithms such as FAN. The number of unclassified faults can be significantly reduced using a SAT-based ATPG approach. In contrast to structural ATPG, SAT solvers work on a Boolean formula in conjunctive normal form (CNF). This results in some disadvantages for SAT solvers when applied to ATPG, e.g. CNF transformation time and loss of structural knowledge. As a result, SAT-based ATPG algorithms are very robust for hard-to-test faults, but suffer from the overhead for easy-to-test faults. We propose the SAT technique dynamic clause activation (DCA) in order to reduce the run time gap between structural and SAT-based ATPG algorithms and, at the same time, retain the high level of robustness. Using DCA, the SAT solver works on a partial formula of a logic circuit which is dynamically extended during the search process using structural knowledge. Furthermore, efficient dynamic learning techniques can be easily integrated within the proposed technique. The approach is evaluated on large industrial circuits.
Keywords
Boolean algebra; automatic test pattern generation; computability; fault simulation; Boolean formula; CNF transformation time; FAN; SAT solvers; SAT-based ATPG; classical structural ATPG algorithms; conjunctive normal form; dynamic clause activation; easy-to-test faults; efficient dynamic learning techniques; hard-to-test faults; industrial circuits; logic circuit; search process; structural knowledge; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Compaction; Computer science; Delay; Logic circuits; Robustness; Test pattern generators; ATPG; CNF; Formal methods; SAT;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2009. ATS '09.
Conference_Location
Taichung
ISSN
1081-7735
Print_ISBN
978-0-7695-3864-8
Type
conf
DOI
10.1109/ATS.2009.26
Filename
5359366
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