• DocumentCode
    2755200
  • Title

    A Post-Silicon Debug Support Using High-Level Design Description

  • Author

    Lee, Yeonbok ; Nishihara, Tasuku ; Matsumoto, Takeshi ; Fujita, Masahiro

  • Author_Institution
    Dept. of Electron. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2009
  • fDate
    23-26 Nov. 2009
  • Firstpage
    137
  • Lastpage
    142
  • Abstract
    In this paper, we propose a post-silicon debug framework utilizing high-level design description, which provides great advantage of comprehensibility and readability in analyzing erroneous behaviors for debugging complicated post-silicon errors. The framework consists of the following methods; mapping between high-level and RTL, extracting error-relevant portions, and rank them by the degree of relevance with the error. We also exhibit several experimental results to show its effectiveness.
  • Keywords
    high level synthesis; program debugging; erroneous behaviors; error-relevant degree; error-relevant portions; high-level design description; post-silicon debug support; Analytical models; Clocks; Computer bugs; Debugging; Design engineering; Electronic equipment testing; Information analysis; Information systems; System testing; Systems engineering and theory; HW design debug; high-level design; post-silicon debug;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2009. ATS '09.
  • Conference_Location
    Taichung
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3864-8
  • Type

    conf

  • DOI
    10.1109/ATS.2009.28
  • Filename
    5359378