DocumentCode :
2755200
Title :
A Post-Silicon Debug Support Using High-Level Design Description
Author :
Lee, Yeonbok ; Nishihara, Tasuku ; Matsumoto, Takeshi ; Fujita, Masahiro
Author_Institution :
Dept. of Electron. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
fYear :
2009
fDate :
23-26 Nov. 2009
Firstpage :
137
Lastpage :
142
Abstract :
In this paper, we propose a post-silicon debug framework utilizing high-level design description, which provides great advantage of comprehensibility and readability in analyzing erroneous behaviors for debugging complicated post-silicon errors. The framework consists of the following methods; mapping between high-level and RTL, extracting error-relevant portions, and rank them by the degree of relevance with the error. We also exhibit several experimental results to show its effectiveness.
Keywords :
high level synthesis; program debugging; erroneous behaviors; error-relevant degree; error-relevant portions; high-level design description; post-silicon debug support; Analytical models; Clocks; Computer bugs; Debugging; Design engineering; Electronic equipment testing; Information analysis; Information systems; System testing; Systems engineering and theory; HW design debug; high-level design; post-silicon debug;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
ISSN :
1081-7735
Print_ISBN :
978-0-7695-3864-8
Type :
conf
DOI :
10.1109/ATS.2009.28
Filename :
5359378
Link To Document :
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