DocumentCode :
2755258
Title :
Optical constants of lead sulfide in the 3-11 microns window
Author :
Elfalla, I. ; Zaki, A.H. ; Alian, S.
Author_Institution :
Egyptian Armed Forces, Egypt
fYear :
1999
fDate :
23-25 Feb 1999
Abstract :
Lead sulfide (PbS) in thin film form was prepared by thermal evaporation in order to evaluate its optical characteristics. The absorption coefficient of lead sulfide in the 3-11 microns band of the infrared spectrum was calculated under smooth and rough surface conditions. The calculated and measured absorption coefficient was in a good agreement with that published by Semiletov. These results were an order of magnitude higher than that published in the handbook of optical constants of solids and referred to Scanlon
Keywords :
IV-VI semiconductors; absorption coefficients; infrared spectra; lead compounds; refractive index; rough surfaces; semiconductor thin films; 3 to 11 micron; PbS; absorption coefficient; infrared spectrum; optical characteristics; optical constants; rough surface conditions; smooth surface conditions; thermal evaporation; thin film form; Electromagnetic wave absorption; Lead; Optical films; Optical refraction; Optical surface waves; Optical variables control; Refractive index; Rough surfaces; Substrates; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Science Conference, 1999. NRSC '99. Proceedings of the Sixteenth National
Conference_Location :
Cairo
Print_ISBN :
977-5031-62-1
Type :
conf
DOI :
10.1109/NRSC.1999.760938
Filename :
760938
Link To Document :
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