• DocumentCode
    2755258
  • Title

    Optical constants of lead sulfide in the 3-11 microns window

  • Author

    Elfalla, I. ; Zaki, A.H. ; Alian, S.

  • Author_Institution
    Egyptian Armed Forces, Egypt
  • fYear
    1999
  • fDate
    23-25 Feb 1999
  • Abstract
    Lead sulfide (PbS) in thin film form was prepared by thermal evaporation in order to evaluate its optical characteristics. The absorption coefficient of lead sulfide in the 3-11 microns band of the infrared spectrum was calculated under smooth and rough surface conditions. The calculated and measured absorption coefficient was in a good agreement with that published by Semiletov. These results were an order of magnitude higher than that published in the handbook of optical constants of solids and referred to Scanlon
  • Keywords
    IV-VI semiconductors; absorption coefficients; infrared spectra; lead compounds; refractive index; rough surfaces; semiconductor thin films; 3 to 11 micron; PbS; absorption coefficient; infrared spectrum; optical characteristics; optical constants; rough surface conditions; smooth surface conditions; thermal evaporation; thin film form; Electromagnetic wave absorption; Lead; Optical films; Optical refraction; Optical surface waves; Optical variables control; Refractive index; Rough surfaces; Substrates; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference, 1999. NRSC '99. Proceedings of the Sixteenth National
  • Conference_Location
    Cairo
  • Print_ISBN
    977-5031-62-1
  • Type

    conf

  • DOI
    10.1109/NRSC.1999.760938
  • Filename
    760938