Title :
Testing transition delay faults in modified Booth multipliers by using C-testable and SIC patterns
Author :
Liang, Hsing-Chung ; Huang, Pao-Hsin
Author_Institution :
Chung Yung Christian Univ., Chung Yung
fDate :
Oct. 30 2007-Nov. 2 2007
Abstract :
In this paper, we design a novel modified Booth multiplier and generate test patterns for transition delay faults (TDF) at cell-level and gate-level descriptions of the multipliers. Regular structures of these multipliers make single stuck-at faults (SAF) at both description levels be C-testable. Single TDF of the multipliers are also detectable with constant test pairs since the second vector for a TDF is also a test pattern of a SAF at the same faulty site. We generate these required constant test pairs, which are fewer than those obtained by commercial tools. These test pairs can also detect all SAF at both description levels. In addition, a TDF within a cell behaves sequentially at the cell´s I/O, which is very similar to the definition of RS-CFM (realistic sequential cell fault model). Consequently, we also generate required SIC (single input change) test pairs for RS-CFM and verify their efficiency on testing RS-CFM and TDF. The number of searched SIC test pairs is linear with respect to multiplier sizes, just like those provided by a previous work. Nevertheless, comparing with that work, we can generate very few SIC test pairs to achieve similarly high fault coverage for RS-CFM.
Keywords :
logic gates; multiplying circuits; C-testable patterns; SIC Patterns; gate-level descriptions; modified booth multipliers; single stuck-at faults; transition delay faults; Adders; Circuit faults; Circuit testing; Delay; Electronic equipment testing; Fault detection; Logic arrays; Logic testing; Silicon carbide; Test pattern generators;
Conference_Titel :
TENCON 2007 - 2007 IEEE Region 10 Conference
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-1272-3
Electronic_ISBN :
978-1-4244-1272-3
DOI :
10.1109/TENCON.2007.4429067