DocumentCode :
275533
Title :
Assessment of the reliability of AI programs
Author :
Bastani, Farokh ; Chen, Ing-Ray
Author_Institution :
Dept. of Comput. Sci., Houston Univ., TX, USA
fYear :
1990
fDate :
6-9 Nov 1990
Firstpage :
753
Lastpage :
759
Abstract :
Analytical tools for assessing the reliability of AI (artificial intelligence) programs are developed. It is shown that conventional software reliability models must be modified to incorporate certain special characteristics of AI programs, such as: failures due to intrinsic faults, e.g., limitations due to heuristics and other basic AI techniques; a fuzzy correctness criterion, i.e., the difficulty in accurately classifying the output of some AI programs as correct or incorrect; computation time versus response time tradeoffs; and reliability growth due to an evolving knowledge base. The authors illustrate the approach by modifying the Musa-Okumoto (J.D. Musa and K. Okumoto, 1984), software reliability growth model to incorporate failures due to intrinsic faults and to accept fuzzy failure data. They also analyze in detail the reliability of heuristics programs in real-time situations and show that under certain conditions the cost based A* algorithm is less reliable than the node-based A* algorithm
Keywords :
fuzzy logic; heuristic programming; knowledge based systems; software reliability; AI programs; basic AI techniques; computation time; conventional software reliability models; cost based A* algorithm; evolving knowledge base; fuzzy correctness criterion; fuzzy failure data; heuristics programs; intrinsic faults; node-based A* algorithm; real-time situations; reliability growth; response time tradeoffs; software reliability growth model; special characteristics; Artificial intelligence; Costs; Delay; Embedded computing; Failure analysis; Manufacturing automation; Real time systems; Robot control; Software reliability; Time factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Tools for Artificial Intelligence, 1990.,Proceedings of the 2nd International IEEE Conference on
Conference_Location :
Herndon, VA
Print_ISBN :
0-8186-2084-6
Type :
conf
DOI :
10.1109/TAI.1990.130433
Filename :
130433
Link To Document :
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