DocumentCode
2755401
Title
Why automate optical inspection?
Author
Raymond, Douglas W. ; Haigh, Dominic F.
Author_Institution
Teradyne/Control Autom., USA
fYear
1997
fDate
1-6 Nov 1997
Firstpage
1033
Abstract
It is suggested that automated optical inspection (AOI) competes effectively to fill the in-circuit test gap. AOI adds no unwelcome technologies to the workplace. Its programming and its results are simple and understandable in visual terms. AOI is thus considered high in strength, simplicity and universality. It is expected to grow rapidly, driven by the never ending demand for strong, simple, universal inspection methods
Keywords
automatic optical inspection; automatic testing; integrated circuit testing; printed circuit testing; AOI; IC testing; PCB testing; automated optical inspection; in-circuit test; universality; Assembly; Automatic control; Automatic optical inspection; Automation; Circuit testing; Electrical fault detection; Humans; Particle beam optics; Printed circuits; Quality assurance;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1997. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-4209-7
Type
conf
DOI
10.1109/TEST.1997.639723
Filename
639723
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