Title :
Why automate optical inspection?
Author :
Raymond, Douglas W. ; Haigh, Dominic F.
Author_Institution :
Teradyne/Control Autom., USA
Abstract :
It is suggested that automated optical inspection (AOI) competes effectively to fill the in-circuit test gap. AOI adds no unwelcome technologies to the workplace. Its programming and its results are simple and understandable in visual terms. AOI is thus considered high in strength, simplicity and universality. It is expected to grow rapidly, driven by the never ending demand for strong, simple, universal inspection methods
Keywords :
automatic optical inspection; automatic testing; integrated circuit testing; printed circuit testing; AOI; IC testing; PCB testing; automated optical inspection; in-circuit test; universality; Assembly; Automatic control; Automatic optical inspection; Automation; Circuit testing; Electrical fault detection; Humans; Particle beam optics; Printed circuits; Quality assurance;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639723
