Title :
Scan Compression Implementation in Industrial Design - Case Study
Author :
Hsu, Dragon ; Press, Ron
Author_Institution :
Ralink Technol. Corp., Hsinchu, Taiwan
Abstract :
Embedded scan test compression is used to enable high test quality and has become a standard practice on many designs. This paper describes power and timing experiences related to embedded compression technology. A commercial tool was used to implement EDT compression technology in three wireless designs. The case study and results demonstrate the effect of power reduction methods and timing closure considerations.
Keywords :
automatic test pattern generation; embedded systems; integrated circuit design; integrated circuit testing; ATPG; EDT compression; automatic test pattern generation; embedded deterministic test compression technology; embedded scan test compression; industrial design; power reduction methods; scan compression implementation; timing closure considerations; Testing; Timing; EDT; component; embedded compression; test power; timing;
Conference_Titel :
Asian Test Symposium, 2009. ATS '09.
Conference_Location :
Taichung
Print_ISBN :
978-0-7695-3864-8
DOI :
10.1109/ATS.2009.89
