• DocumentCode
    2755707
  • Title

    Fine line multilayer substrates with very high density TAB

  • Author

    Dehaine, G. ; Kurzweil, K. ; Arrowsmith, R.P. ; Chandler, N. ; Tyler, S.G.

  • Author_Institution
    Bull SA, Paris, France
  • fYear
    1989
  • fDate
    26-28 Apr 1989
  • Firstpage
    7
  • Lastpage
    11
  • Abstract
    The authors describe ESPRIT Project 958, which is concerned with the development of two major interconnect technologies: high-density TAB (tape automated bonding) and a compatible high-density multilayer substrate technology. The main developments in TAB have been aimed at enabling the bonding of VLSI chips on high-density substrates and include improvements in bump formation, tape realization, and the bonding (attachment) operations. For the substrates, the main activities have been in developing the technology for fabricating very fine tracks, gaps, and via holes, to match the TAB VLSI devices. These, together with electrical and thermal design, modeling, and testing techniques, have led to the building of multichip, high-density demonstrators, dissipating high power and exhibiting high speed (Gb/s) operation
  • Keywords
    VLSI; integrated circuit technology; lead bonding; printed circuit design; research initiatives; substrates; surface mount technology; ESPRIT Project 958; SMT; VLSI chips; attachment; bonding; bump formation; electrical design; fine line substrates; high density TAB; high speed operation; interconnect technologies; microassembly; modeling; multichip configurations; multilayer substrate technology; packaging, surface mounting; tape automated bonding; testing techniques; thermal design; Bonding; Circuit testing; Electronic packaging thermal management; Integrated circuit interconnections; Integrated circuit modeling; Integrated circuit packaging; Integrated circuit technology; Nonhomogeneous media; Thermal management; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/IEMTS.1989.76096
  • Filename
    76096