Title :
A digraph model for risk identification and mangement in SCADA systems
Author :
Guan, Jian ; Graham, James R. ; Hieb, J.L.
Author_Institution :
Dept. of Comput. Inf. Syst., Univ. of Louisville, Louisville, KY, USA
Abstract :
Supervisory control and data acquisition (SCADA) systems are critical to today´s industrial facilities and infrastructures. SCADA systems have evolved into large and complex networks of information systems and are increasingly vulnerable to various types of cyber-security risks. Identifying and managing risks in SCADA systems has become critical in ensuring the safety and reliability of these facilities and infrastructures. Most of the existing research on SCADA risk modeling and management has focused on probability-based or quantitative approaches. While probabilistic approaches have proven to be useful, they also suffer from common problems such as simplifying assumptions, large implementation costs, and inability to completely capture all the important aspects of risk. This paper proposes a digraph model for SCADA systems that allows formal, explicit representation of a SCADA system. A number of risk management methods are presented and discussed for a SCADA system based on the proposed model. The methods are applied to a chemical distillation application as a case study, and shows promising initial results in identifying areas of system vulnerability.
Keywords :
SCADA systems; directed graphs; probability; reliability; risk management; safety; security of data; SCADA risk modeling; SCADA systems; chemical distillation application; cyber-security risks; digraph model; information systems; probabilistic approach; reliability; risk identification; risk management; safety; supervisory control and data acquisition; Internet; Reliability; SCADA systems; Wide area networks; Control Systems; Risk Management; Supervisory Control and Data Acquisition;
Conference_Titel :
Intelligence and Security Informatics (ISI), 2011 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0082-8
DOI :
10.1109/ISI.2011.5983990