DocumentCode :
2756158
Title :
So what is an optimal test mix? A discussion of the SEMATECH methods experiment
Author :
Nigh, Phil ; Needham, Wayne ; Butler, Ken ; Maxwell, Peter ; Aitken, Rob ; Maly, Wojciech
Author_Institution :
IBM Inc., USA
fYear :
1997
fDate :
1-6 Nov 1997
Firstpage :
1037
Lastpage :
1038
Abstract :
The SEMATECH “Test Methods Evaluation” study, Project Number S-121, is an experiment to determine the relative merits of several test methodologies often used by SEMATECH member companies and other IC manufacturers. Conclusions drawn from the experiment thus far have indicated that each test methodology uniquely detects defects. This experimentation and analysis would not have been possible outside a consortium setting such as SEMATECH. Its conclusions may affect other major segments of the industry, including ATE manufacturers, CAD vendors, and academia. This paper gives a brief overview of the experiment and summarizes its findings
Keywords :
CMOS logic circuits; application specific integrated circuits; automatic testing; integrated circuit testing; logic testing; ATE manufacture; CAD vendors; CMOS ASIC; IC manufacture; IC testing; academia; logic testing; optimal test mix; Application specific integrated circuits; Computer aided manufacturing; Delay; Design automation; Instruments; Integrated circuit testing; Manufacturing industries; Packaging; Performance evaluation; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-4209-7
Type :
conf
DOI :
10.1109/TEST.1997.639727
Filename :
639727
Link To Document :
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