Title :
Statistical model for the transitional error probability of shadowing mobile channel
Author :
Hadzialic, M. ; Lipovac, V. ; Nemsic, B.
Author_Institution :
Fac. of Electr. Eng., Sarajevo Univ., Sarajevo
Abstract :
In this paper, we present an analytical model aimed to evaluate effects of very slow Nakagami/Ricean fading, shadowing and additive Gaussian noise on the mutual interdependence between successive errors in NCMFSK, MCPSK and MCQAM systems. We present the closed form solutions for transition probabilities and show that strong amplitude correlation within several successive signaling intervals, due to fast signal fluctuations, causes mutually dependent error occurrences in these intervals. We demonstrate how the transition probabilities are sensitive to both fading and shadowing severity. Apparently, this problem is even more significant in presence of deep fluctuation of shadowing. This finally points to importance of analyzing such error dependency in presence of a very slow fading, which actually represents the scenarios where correlation coefficient of amplitude fluctuations on successive signaling intervals is equal to 1. The results obtained in this paper can be useful in the design of burst error control in fading/shadowing channel.
Keywords :
AWGN; Nakagami channels; Rician channels; frequency shift keying; mobile radio; phase shift keying; probability; quadrature amplitude modulation; statistical analysis; telecommunication signalling; Nakagami-Ricean fading; additive Gaussian noise; burst error control; fading-shadowing channel; fast signal fluctuations; mobile channel; statistical model; transitional error probability; Additive noise; Analytical models; Closed-form solution; Error analysis; Error probability; Fading; Fluctuations; Gaussian noise; Shadow mapping; Signal analysis; fading; mobile channel; performance;
Conference_Titel :
Electrotechnical Conference, 2008. MELECON 2008. The 14th IEEE Mediterranean
Conference_Location :
Ajaccio
Print_ISBN :
978-1-4244-1632-5
Electronic_ISBN :
978-1-4244-1633-2
DOI :
10.1109/MELCON.2008.4618548