The modulus of the Fourier transform in image reconstruction

Reconstructing a three-dimensional surface profile from only the modulus of the Fourier transform of its reflectance function is usually regarded as impossible. However, there are several important applications where such reconstruction would be extremely useful. These include X-ray crystallography electron microscopy and optical image processing where the Fourier transform domain is extensively invoked. This paper introduces an aspect of a research programme based at Middlesex Polytechnic in which selected classes of surfaces are being characterised using only the modulus of their optical Fourier transforms