Title :
On the design of self-checking functional units based on Shannon circuits
Author :
Favilli, M. ; Metra, Cecilia
Author_Institution :
Ferrara Univ., Italy
Abstract :
This paper investigates the application of Shannon (BDD) circuits, that feature interesting low-power capabilities, to the design of self-checking functional units. A technique is proposed that, by using a time redundancy approach, makes this kind of circuits totally self-checking with respect to stuck-at-faults. For a set of possibly used pass-transistor-based CMOS implementations, we show that the totally self-checking or the strongly fault secure properties hold for a wider set of realistic faults, including transistors stuck-open/on and bridgings.
Keywords :
CMOS logic circuits; automatic testing; binary decision diagrams; logic design; logic testing; low-power electronics; redundancy; CMOS logic circuit; Shannon circuit; binary decision diagram; bridging fault; low power design; pass transistor; self-checking functional unit; stuck-at fault; stuck-on fault; stuck-open fault; time redundancy; Binary decision diagrams; Circuit faults; Digital systems; Electrical fault detection; Fault detection; Fault tolerant systems; Logic design; Minimization; Safety; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich, Germany
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761148
