• DocumentCode
    2757237
  • Title

    Functional verification methodology for microprocessors using the Genesys test-program generator. Application to the x86 microprocessors family

  • Author

    Fournier, Laurent ; Arbetman, Yaron ; Levinger, Moshe

  • Author_Institution
    Res. Lab., IBM Israel Sci. & Technol. Center, Haifa, Israel
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    434
  • Lastpage
    441
  • Abstract
    Even though the importance of microprocessor design verification is widely acknowledged, no rigorous methodology is being commonly followed for its realization. This paper attempts to delineate such a methodology, and shows how it is promoted by Genesys, an automatic pseudo-random test-program generator. The methodology relies on a verification plan which induces smart sets of tests that carry out the verification tasks. The paper reports on an application of this methodology, using Genesys, to verify an x86 design and describes, in particular, how this methodology could have helped to avoid known escape bugs, such as the recent two infamous Pentium Floating Point bugs
  • Keywords
    circuit CAD; formal verification; integrated circuit design; integrated circuit testing; microprocessor chips; Genesys automatic pseudo-random test program generator; Pentium floating point bug; functional verification; x86 microprocessor design; Computer bugs; Feedback; Frequency; Libraries; Microprocessors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
  • Conference_Location
    Munich
  • Print_ISBN
    0-7695-0078-1
  • Type

    conf

  • DOI
    10.1109/DATE.1999.761162
  • Filename
    761162