DocumentCode
2757256
Title
Dielectric response of filled and flexibilized epoxy resin
Author
Preda, I. ; Castellon, J. ; Couderc, H. ; Fréchette, M. ; Savoie, S. ; Krivda, A.
Author_Institution
Inst. d´´Electron. du Sud (IES), Univ. Montpellier 2, Montpellier, France
fYear
2012
fDate
10-13 June 2012
Firstpage
53
Lastpage
58
Abstract
In this work, several nanostructured microcomposite epoxy resin compounds, with or without flexibilized network, are analyzed. Scanning Electron Microscopy is used for the investigation of the phase separation between the flexibilizer and the polymer matrix. Differential Scanning Calorimetry results showed an enhanced molecular mobility for the polymer chains confirmed the expected influence of the flexibilizer. Also, the addition of micro and nanoparticles into epoxy resin increased the glass transition temperature since the fillers prevent the molecular movement of the polymeric chains. Broadband Dielectric Spectroscopy allowed us to determine the influence of the flexibilizer and the influence of the nano and micro filler ratio on the relaxation time versus temperature. After fitting the relaxation peaks using Havriliak-Negami functions, noticeable differences were observed for the β relaxation processes.
Keywords
differential scanning calorimetry; filled polymers; glass transition; nanocomposites; nanoparticles; permittivity; phase separation; resins; scanning electron microscopy; β relaxation process; Havriliak-Negami function; broadband dielectric spectroscopy; differential scanning calorimetry; flexibilizer; glass transition temperature; microfiller ratio; molecular mobility; nanofiller ratio; nanostructured microcomposite epoxy resin compounds; phase separation; polymer matrix; polymeric chain; relaxation time; scanning electron microscopy; temperature; Dielectrics; Glass; Heating; Polymers; Temperature; Temperature measurement; cycloaliphatic epoxy resin; flexibilizer; microcomposite; nanocomposite; silica filler;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
Conference_Location
San Juan, PR
ISSN
1089-084X
Print_ISBN
978-1-4673-0488-7
Electronic_ISBN
1089-084X
Type
conf
DOI
10.1109/ELINSL.2012.6251425
Filename
6251425
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