Title :
Bit boundary testing coverage
Author :
Nicolae, Goga ; Moldoveanu, Florica
Author_Institution :
Nat. Res. Inst. for Math. & Comput. Sci., CWI, Amsterdam
Abstract :
In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard
Keywords :
boundary-value problems; conformance testing; standards; ASN standard; bit boundary testing coverage; conformance testing; Testing;
Conference_Titel :
Electrical and Computer Engineering, 2005. Canadian Conference on
Conference_Location :
Saskatoon, Sask.
Print_ISBN :
0-7803-8885-2
DOI :
10.1109/CCECE.2005.1556958
