• DocumentCode
    2757518
  • Title

    Bit boundary testing coverage

  • Author

    Nicolae, Goga ; Moldoveanu, Florica

  • Author_Institution
    Nat. Res. Inst. for Math. & Comput. Sci., CWI, Amsterdam
  • fYear
    2005
  • fDate
    1-4 May 2005
  • Firstpage
    408
  • Lastpage
    411
  • Abstract
    In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard
  • Keywords
    boundary-value problems; conformance testing; standards; ASN standard; bit boundary testing coverage; conformance testing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 2005. Canadian Conference on
  • Conference_Location
    Saskatoon, Sask.
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-8885-2
  • Type

    conf

  • DOI
    10.1109/CCECE.2005.1556958
  • Filename
    1556958
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2757518