• DocumentCode
    2757585
  • Title

    Exploring the combination of IDDQ and iDDt testing: energy testing

  • Author

    Rius, Josep ; Figueras, Joan

  • Author_Institution
    Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    543
  • Lastpage
    548
  • Abstract
    The feasibility of combining IDDQ and and iDDt testing to detect defective CMOS circuits by measuring the energy consumed by the tested circuit is considered. The energy chronogram of a circuit is used as an energy signature which makes it possible to distinguish between defect-free and defective circuits. Exploratory implementation of the proposed method is presented and experimental results obtained from in-house full custom circuits and commercially available circuits are discussed
  • Keywords
    CMOS digital integrated circuits; automatic testing; integrated circuit testing; CMOS circuits; IDDQ testing; defect-free circuits; defective circuit detection; energy chronogram; energy signature; energy testing; iDDt testing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
  • Conference_Location
    Munich
  • Print_ISBN
    0-7695-0078-1
  • Type

    conf

  • DOI
    10.1109/DATE.1999.761180
  • Filename
    761180
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2757585