Title :
Air-Assisted Passive Ionizer for a Charged Pipe
Author :
Sugimoto, T. ; Kitamura, A. ; Higashiyama, Y.
Abstract :
An air-assisted passive ionizer was developed for the elimination of static charges on charged particles accumulated in pipes, hoppers or silos. The ionizer is a grounded electrode with a sharp tip at which corona discharge take place due to the electric field produced by the charged particles. A charged plastic pipe was used to test the performance of the passive ionizer. The ionizer was placed in the center of the charged pipe to effectively meet the corona inception conditions. Fast air flow was supplied to the tip of the ionizer to increase the efficiency of static elimination. The surface potential distribution of the charged pipe before and after static elimination was measured both with and without the air assist. The results indicate that the air assist plays an important role in the electrostatic elimination process of the charged pipe. A simple model using a charged pipe and a grounded sphere was also proposed. By calculating the electric field strength formed by the charges on the cylinder and its image charges inside the grounded sphere, the electric field distribution in the center axis of the charged pipe could be estimated analytically. The efficiency of charge elimination was found to be a function of the dimension of the charged pipe, the radius of the grounded sphere and the initial potential at the center of the charged pipe.
Keywords :
corona; earth electrodes; electric field measurement; ionisation; materials handling; occupational safety; pipe flow; pipes; safety systems; air assisted passive ionizer; air flow; charged plastic pipe; corona discharge; corona inception; electric field distribution; electric field strength; electrostatic elimination process; performance test; static charge elimination; surface potential distribution; Corona; Discharges; Electric fields; Electric potential; Electrodes; Electrostatics; Surface discharges;
Conference_Titel :
Industry Applications Society Annual Meeting (IAS), 2010 IEEE
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4244-6393-0
DOI :
10.1109/IAS.2010.5615612