Title :
Single Chip Or Hybrid System Integration
Author_Institution :
IMEC
Keywords :
CMOS technology; Clocks; Computer architecture; Dielectric loss measurement; Manufacturing; Microelectronics; Packaging; Process design; Semiconductor device measurement; System-on-a-chip;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich, Germany
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761192
