• DocumentCode
    2757962
  • Title

    D10. Co-tunneling effect on single electron circuits

  • Author

    Elabd, Ali A. ; Shalaby, Abdelaziz T. ; El-Rabaie, El-Sayed M.

  • Author_Institution
    Fac. of Electron. Eng., Menoufia Univ., Menouf, Egypt
  • fYear
    2015
  • fDate
    24-26 March 2015
  • Firstpage
    396
  • Lastpage
    402
  • Abstract
    In this paper, we discuss the effect of simultaneous tunneling events on single electron circuits. Single electron circuits are classified into two types: the first is a small single electron circuit with one island, and the second type is a large circuit with multi islands. The simulation of co-tunneling process is incorporated in a new version of our simulator MUSES. The simulation results for small circuits´ type are compared with the analytical equations for certain range of temperature that is presented by the founders of the phenomena. Also the results for large circuits´ type are compared with the widely accepted nanostructures simulator SIMON.
  • Keywords
    circuit simulation; single electron devices; tunnelling; MUSES; SIMON; co-tunneling effect; nanostructures simulator; single electron circuit; Logic gates; Tunneling; Co-Tunneling; MUSES; Quantum tunneling; Single Electron Circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference (NRSC), 2015 32nd National
  • Conference_Location
    6th of October City
  • Print_ISBN
    978-1-4799-9945-3
  • Type

    conf

  • DOI
    10.1109/NRSC.2015.7117854
  • Filename
    7117854