Title :
Coupled noise estimation for distributed RC interconnect model
Author :
Wang, Janet M. ; Yu, Qingjian ; Kuh, Ernest S.
Author_Institution :
California Univ., Berkeley, CA, USA
Abstract :
With the increase in signal speed and the development of process technology, distributed RC line model is found to be more suitable for on-chip interconnects than lumped RC model, especially for interconnects around and below 0.25 /spl mu/m. In this paper, we first describe a new explicit form for crosstalk approximation for coupled RC lines. Then we introduce a novel passive model order reduction technique for distributed RC lines. These two parts serve as two steps in static noise analysis of full on-chip interconnect networks called pruning process and static analysis process.
Keywords :
crosstalk; distributed parameter networks; integrated circuit interconnections; integrated circuit modelling; integrated circuit noise; transient analysis; wiring; 0.25 micron; coupled RC lines; coupled noise estimation; crosstalk approximation; distributed RC interconnect model; on-chip interconnects; passive model order reduction technique; process technology; pruning process; signal speed; static analysis process; static noise analysis; Capacitance; Computational efficiency; Crosstalk; Network-on-a-chip; Noise reduction; Reduced order systems; Signal processing; Transient analysis; Voltage; Wiring;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings
Conference_Location :
Munich, Germany
Print_ISBN :
0-7695-0078-1
DOI :
10.1109/DATE.1999.761200