Title :
A reliability integrated acceptance test plan for series systems whose components following exponential distributions
Author :
Li, Xue-jing ; Yu, Dan
Author_Institution :
Coll. of Appl. Sci., Beijing Univ. of Technol., Beijing, China
Abstract :
For the series systems whose components follow the exponential distribution, we put forward the reliability integrated acceptance test plan based on the components´ information. Finally, we will provide a simulation example to demonstrate our method.
Keywords :
exponential distribution; reliability theory; testing; component information; exponential distributions; reliability integrated acceptance test plan; series systems; Reliability engineering;
Conference_Titel :
Intelligence and Security Informatics (ISI), 2011 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-0082-8
DOI :
10.1109/ISI.2011.5984110
