DocumentCode :
2758058
Title :
The effect of water ingress on dielectric properties of polyethylene cable insulation
Author :
Bernier, S. ; Drapeau, J.-F. ; Jean, D. ; David, É
Author_Institution :
Unite Expertise Equipement Electr., Inst. de Rech. d´´Hydro-Quebec (IREQ), Varennes, QC, Canada
fYear :
2012
fDate :
10-13 June 2012
Firstpage :
270
Lastpage :
276
Abstract :
This paper reports on dielectric loss diagnostic features (absolute values, voltage dependence, etc.) measurements and results of residual breakdown voltages obtained on miniature (RG-58) cables as a function of water absorption and electrical aging by water trees (WT) under a 5 kV/mm voltage stress (AC). The dielectric losses were measured at voltages up to 5 kV (i) in polarization and depolarization using Time Domain Spectroscopy (TDS) and (ii) with a classical very low frequency (VLF) system using a 0.1 Hz sine wave. The corresponding residual AC breakdown voltages were analyzed using the standard procedure. After ~3000 h of water and voltage exposure, aged cable samples showed a relatively low level of degradation, mainly bow tie water trees, with longest being ~19% of insulation thickness. TDS and VLF dielectric loss results show that for such an aging condition, the dielectric response is mainly dominated by the presence of water in the insulation.
Keywords :
absorption; dielectric losses; polyethylene insulation; power cable insulation; trees (electrical); RG-58 cables; TDS; VLF dielectric loss system; dielectric loss diagnostic measurement; dielectric properties; electrical aging; frequency 0.1 Hz; insulation thickness; polyethylene cable insulation; residual AC breakdown voltages; time domain spectroscopy; very low frequency system; voltage stress; water absorption; water ingress effect; water trees; Aging; Cable insulation; Dielectric loss measurement; Dielectric losses; Power cables; Cables; Diagnostics; Dielectric losses; TDS; VLF; Water trees; Weibull;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
Conference_Location :
San Juan, PR
ISSN :
1089-084X
Print_ISBN :
978-1-4673-0488-7
Electronic_ISBN :
1089-084X
Type :
conf
DOI :
10.1109/ELINSL.2012.6251471
Filename :
6251471
Link To Document :
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