Title :
Charge carrier extraction IGBT model for circuit simulators
Author :
Schumann, Jorg ; Eckel, H.
Author_Institution :
Univ. of Rostock, Rostock, Germany
Abstract :
This paper presents a comprehensive physical-based spatial analytical model for the turn-off behavior of a 6,5kV-IGBT and its implementation in the circuit simulator Saber. The basic idea is that the voltage slope at turn-off is determined by the sweep out of the plasma by the difference between the collector current and the MOS channel current. The resulting equations for the width of the space charge region, the electrical field and the collector-emitter voltage can be solved analytically. The switching process from the forward into the blocking state is calculated dynamically in contribution to the carrier distribution and changing electron and holes currents. The implementation of physical laws and measured parameters enable a simulation of the turn off behavior without fitting parameters and give insight into internal device behavior. Despite of complexity the model can be used as circuit simulator model, which enables more exactly conclusions for the IGBT gate control than common circuit simulator models. The created model shows a good performance even under very demanding switching conditions.
Keywords :
circuit simulation; insulated gate bipolar transistors; power semiconductor switches; IGBT gate control; MOS channel current; blocking state; carrier distribution; changing electron; charge carrier extraction IGBT model; circuit simulator Saber; circuit simulator model; collector current; collector emitter voltage; electrical field; holes currents; internal device behavior; physical based spatial analytical model; space charge region; switching condition; switching process; turn off behavior; voltage slope; Capacitance; Insulated gate bipolar transistors; Integrated circuit modeling; Logic gates; Plasmas; Space charge; Switches; IGBT; Simulation; Switching; device model;
Conference_Titel :
Power Electronics and Motion Control Conference (EPE/PEMC), 2012 15th International
Conference_Location :
Novi Sad
Print_ISBN :
978-1-4673-1970-6
Electronic_ISBN :
978-1-4673-1971-3
DOI :
10.1109/EPEPEMC.2012.6397370