DocumentCode
2758376
Title
A methodology to predict the lightning insulation strength for distribution transformers by applications of reduced lightning standard impulse voltages
Author
Lopes, G.P. ; Martinez, M.L.B. ; Salustiano, R. ; Faria, I.P. ; Telles, V.G.C.
Author_Institution
High Voltage Lab., Fed. Univ. of Itajuba, Itajubá, Brazil
fYear
2012
fDate
10-13 June 2012
Firstpage
361
Lastpage
365
Abstract
The lightning withstanding of transformers are based on a set of impulse voltage applications with 1.2/50 μs shape, in accordance with international standards. The standard lightning impulse test is a destructive test, in which the transformer insulation strength is predicted by comparisons between reduced and rated levels for full and chopped impulses. In this paper a different method named “progressive impulse test” is proposed to provide estimation with respect to the voltage level in which evidences of insulation failure appears. Modifications on oscillation frequency of current waveforms may indicate sparks or short-circuits between turns, layers or between windings and the ground. By comparisons among these current waveforms it is possible to predict the insulation performance, as well as manufacturing quality process without the necessity to submit the transformer to all lightning impulse sequence test.
Keywords
impulse testing; lightning protection; power transformer insulation; current waveforms; distribution transformers; insulation failure; international standard; lightning insulation strength prediction; lightning standard impulse voltage reduction; manufacturing quality process; oscillation frequency; progressive impulse test; standard lightning impulse sequence test; transformer insulation strength; transformer lightning withstanding; Lightning; Oil insulation; Power transformer insulation; Sparks; Windings; Lightning impulse test; distribution transformers; insulation failure; short-circuits; spark signals;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation (ISEI), Conference Record of the 2012 IEEE International Symposium on
Conference_Location
San Juan, PR
ISSN
1089-084X
Print_ISBN
978-1-4673-0488-7
Electronic_ISBN
1089-084X
Type
conf
DOI
10.1109/ELINSL.2012.6251490
Filename
6251490
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